Error probability of M-ary DPSK in fast Rician fading and lognormal shadowing

Electronics Letters

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Bibliographic Details
Main Authors: Tan, S.H., Tjhung, T.T.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62151
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Institution: National University of Singapore
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