Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's
10.1109/16.277367
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sg-nus-scholar.10635-621692024-11-10T13:00:41Z Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's Pan, Y. ELECTRICAL ENGINEERING 10.1109/16.277367 IEEE Transactions on Electron Devices 41 2 268-271 IETDA 2014-06-17T06:48:08Z 2014-06-17T06:48:08Z 1994-02 Article Pan, Y. (1994-02). Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's. IEEE Transactions on Electron Devices 41 (2) : 268-271. ScholarBank@NUS Repository. https://doi.org/10.1109/16.277367 00189383 http://scholarbank.nus.edu.sg/handle/10635/62169 A1994NA21300023 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| description |
10.1109/16.277367 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Pan, Y. |
| format |
Article |
| author |
Pan, Y. |
| spellingShingle |
Pan, Y. Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's |
| author_sort |
Pan, Y. |
| title |
Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's |
| title_short |
Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's |
| title_full |
Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's |
| title_fullStr |
Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's |
| title_full_unstemmed |
Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's |
| title_sort |
experimental study of the fowler-nordheim tunneling induced degradation of ldd pmosfet's |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62169 |
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1821188997355929600 |