Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

Journal of Applied Physics

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Main Authors:	Chim, W.K., Leang, S.E., Chan, D.S.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62174
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-62174
record_format	dspace
spelling	sg-nus-scholar.10635-621742024-11-14T10:20:49Z Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm Chim, W.K. Leang, S.E. Chan, D.S.H. ELECTRICAL ENGINEERING Journal of Applied Physics 81 4 1992-2001 JAPIA 2014-06-17T06:48:11Z 2014-06-17T06:48:11Z 1997-02-15 Article Chim, W.K.,Leang, S.E.,Chan, D.S.H. (1997-02-15). Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm. Journal of Applied Physics 81 (4) : 1992-2001. ScholarBank@NUS Repository. 00218979 http://scholarbank.nus.edu.sg/handle/10635/62174 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Journal of Applied Physics
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Chim, W.K. Leang, S.E. Chan, D.S.H.
format	Article
author	Chim, W.K. Leang, S.E. Chan, D.S.H.
spellingShingle	Chim, W.K. Leang, S.E. Chan, D.S.H. Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
author_sort	Chim, W.K.
title	Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
title_short	Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
title_full	Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
title_fullStr	Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
title_full_unstemmed	Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
title_sort	extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62174
_version_	1821230192131047424

Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

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