Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure
10.1109/55.823578
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sg-nus-scholar.10635-622902015-02-23T13:27:48Z Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure Yue, J.M.P. Chim, W.K. Cho, B.J. Chan, D.S.H. Qin, W.H. Kim, Y.-B. Jang, S.-A. Yeo, I.-S. ELECTRICAL ENGINEERING 10.1109/55.823578 IEEE Electron Device Letters 21 3 130-132 EDLED 2014-06-17T06:49:27Z 2014-06-17T06:49:27Z 2000-03 Article Yue, J.M.P.,Chim, W.K.,Cho, B.J.,Chan, D.S.H.,Qin, W.H.,Kim, Y.-B.,Jang, S.-A.,Yeo, I.-S. (2000-03). Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure. IEEE Electron Device Letters 21 (3) : 130-132. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/55.823578" target="_blank">https://doi.org/10.1109/55.823578</a> 07413106 http://scholarbank.nus.edu.sg/handle/10635/62290 NOT_IN_WOS Scopus |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Yue, J.M.P. Chim, W.K. Cho, B.J. Chan, D.S.H. Qin, W.H. Kim, Y.-B. Jang, S.-A. Yeo, I.-S. |
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Yue, J.M.P. Chim, W.K. Cho, B.J. Chan, D.S.H. Qin, W.H. Kim, Y.-B. Jang, S.-A. Yeo, I.-S. |
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Yue, J.M.P. Chim, W.K. Cho, B.J. Chan, D.S.H. Qin, W.H. Kim, Y.-B. Jang, S.-A. Yeo, I.-S. Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure |
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Yue, J.M.P. |
title |
Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure |
title_short |
Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure |
title_full |
Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure |
title_fullStr |
Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure |
title_full_unstemmed |
Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure |
title_sort |
hot-carrier degradation mechanism in narrow- and wide-channel n-mosfet's with recessed locos isolation structure |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/62290 |
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1681085748823982080 |