Improved design for multistate reflectometer (with two power detectors) for measuring reflection coefficients of microwave devices

IEEE Transactions on Instrumentation and Measurement

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Bibliographic Details
Main Authors: Yeo, S.P., Tay, S.T.
Other Authors: ELECTRICAL ENGINEERING
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62311
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Institution: National University of Singapore

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