Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

Solid-State Electronics

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Main Authors:	Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62664
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-62664
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spelling	sg-nus-scholar.10635-626642018-12-24T06:38:06Z Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y. ELECTRICAL ENGINEERING Solid-State Electronics 44 11 2001-2007 SSELA 2014-06-17T06:53:32Z 2014-06-17T06:53:32Z 2000-11-01 Article Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y. (2000-11-01). Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides. Solid-State Electronics 44 (11) : 2001-2007. ScholarBank@NUS Repository. 00381101 http://scholarbank.nus.edu.sg/handle/10635/62664 000165546700016 Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Solid-State Electronics
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y.
format	Article
author	Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y.
spellingShingle	Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y. Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
author_sort	Ang, C.-H.
title	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_short	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_full	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_fullStr	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_full_unstemmed	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_sort	radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62664
_version_	1681085817064259584

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

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