Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs

17th International Zurich Symposium on Electromagnetic Compatibility, 2006

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Bibliographic Details
Main Authors: Yin, W.-Y., Dong, X.T., Mao, J., Li, L.-W.
Other Authors: TEMASEK LABORATORIES
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69533
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Institution: National University of Singapore