Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs

17th International Zurich Symposium on Electromagnetic Compatibility, 2006

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Main Authors: Yin, W.-Y., Dong, X.T., Mao, J., Li, L.-W.
Other Authors: TEMASEK LABORATORIES
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69533
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-695332024-11-12T20:55:43Z Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs Yin, W.-Y. Dong, X.T. Mao, J. Li, L.-W. TEMASEK LABORATORIES ELECTRICAL & COMPUTER ENGINEERING 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 2006 445-448 2014-06-19T03:01:46Z 2014-06-19T03:01:46Z 2006 Conference Paper Yin, W.-Y.,Dong, X.T.,Mao, J.,Li, L.-W. (2006). Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs. 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 2006 : 445-448. ScholarBank@NUS Repository. 3952299049 http://scholarbank.nus.edu.sg/handle/10635/69533 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
author2 TEMASEK LABORATORIES
author_facet TEMASEK LABORATORIES
Yin, W.-Y.
Dong, X.T.
Mao, J.
Li, L.-W.
format Conference or Workshop Item
author Yin, W.-Y.
Dong, X.T.
Mao, J.
Li, L.-W.
spellingShingle Yin, W.-Y.
Dong, X.T.
Mao, J.
Li, L.-W.
Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
author_sort Yin, W.-Y.
title Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
title_short Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
title_full Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
title_fullStr Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
title_full_unstemmed Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
title_sort breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of hp-emps
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/69533
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