Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs

17th International Zurich Symposium on Electromagnetic Compatibility, 2006

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書目詳細資料
Main Authors: Yin, W.-Y., Dong, X.T., Mao, J., Li, L.-W.
其他作者: TEMASEK LABORATORIES
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/69533
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