Determination of the local electric field strength by energy dispersive Photon Emission Microscopy

10.1109/IRPS.2010.5488819

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Bibliographic Details
Main Authors:	Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69897
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Institution:	National University of Singapore

Description
Summary:	10.1109/IRPS.2010.5488819

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