Determination of the local electric field strength by energy dispersive Photon Emission Microscopy

10.1109/IRPS.2010.5488819

Saved in:
Bibliographic Details
Main Authors: Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69897
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore