Determination of the local electric field strength by energy dispersive Photon Emission Microscopy
10.1109/IRPS.2010.5488819
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Main Authors: | Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69897 |
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Institution: | National University of Singapore |
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