Effects of electron-beam lithography on thin gate oxide reliability

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors: Chong, P.F., Cho, B.J., Chor, E.F., Joo, M.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70097
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-700972015-03-23T20:19:03Z Effects of electron-beam lithography on thin gate oxide reliability Chong, P.F. Cho, B.J. Chor, E.F. Joo, M.S. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 55-58 2014-06-19T03:08:12Z 2014-06-19T03:08:12Z 2001 Conference Paper Chong, P.F.,Cho, B.J.,Chor, E.F.,Joo, M.S. (2001). Effects of electron-beam lithography on thin gate oxide reliability. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 55-58. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/70097 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Chong, P.F.
Cho, B.J.
Chor, E.F.
Joo, M.S.
format Conference or Workshop Item
author Chong, P.F.
Cho, B.J.
Chor, E.F.
Joo, M.S.
spellingShingle Chong, P.F.
Cho, B.J.
Chor, E.F.
Joo, M.S.
Effects of electron-beam lithography on thin gate oxide reliability
author_sort Chong, P.F.
title Effects of electron-beam lithography on thin gate oxide reliability
title_short Effects of electron-beam lithography on thin gate oxide reliability
title_full Effects of electron-beam lithography on thin gate oxide reliability
title_fullStr Effects of electron-beam lithography on thin gate oxide reliability
title_full_unstemmed Effects of electron-beam lithography on thin gate oxide reliability
title_sort effects of electron-beam lithography on thin gate oxide reliability
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/70097
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