Impact of metal gate work function on nano CMOS device performance
International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT
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2014
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sg-nus-scholar.10635-705372024-11-14T09:00:45Z Impact of metal gate work function on nano CMOS device performance Hou, Y.T. Low, T. Xu, B. Li, M.-F. Samudra, G. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 1 57-60 2014-06-19T03:13:17Z 2014-06-19T03:13:17Z 2004 Conference Paper Hou, Y.T.,Low, T.,Xu, B.,Li, M.-F.,Samudra, G.,Kwong, D.L. (2004). Impact of metal gate work function on nano CMOS device performance. International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 1 : 57-60. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/70537 NOT_IN_WOS Scopus |
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International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Hou, Y.T. Low, T. Xu, B. Li, M.-F. Samudra, G. Kwong, D.L. |
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Conference or Workshop Item |
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Hou, Y.T. Low, T. Xu, B. Li, M.-F. Samudra, G. Kwong, D.L. |
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Hou, Y.T. Low, T. Xu, B. Li, M.-F. Samudra, G. Kwong, D.L. Impact of metal gate work function on nano CMOS device performance |
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Hou, Y.T. |
title |
Impact of metal gate work function on nano CMOS device performance |
title_short |
Impact of metal gate work function on nano CMOS device performance |
title_full |
Impact of metal gate work function on nano CMOS device performance |
title_fullStr |
Impact of metal gate work function on nano CMOS device performance |
title_full_unstemmed |
Impact of metal gate work function on nano CMOS device performance |
title_sort |
impact of metal gate work function on nano cmos device performance |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/70537 |
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