Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering

10.1109/IPFA.2009.5232561

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Bibliographic Details
Main Authors:	Chin, A., Lin, S.H., Yang, H.J., Tsai, C.Y., Yeh, F.S., Liao, C.C., Li, M.-F.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/70557
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-70557
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spelling	sg-nus-scholar.10635-705572015-03-13T00:38:57Z Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering Chin, A. Lin, S.H. Yang, H.J. Tsai, C.Y. Yeh, F.S. Liao, C.C. Li, M.-F. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IPFA.2009.5232561 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 641-645 2014-06-19T03:13:30Z 2014-06-19T03:13:30Z 2009 Conference Paper Chin, A.,Lin, S.H.,Yang, H.J.,Tsai, C.Y.,Yeh, F.S.,Liao, C.C.,Li, M.-F. (2009). Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 641-645. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2009.5232561" target="_blank">https://doi.org/10.1109/IPFA.2009.5232561</a> 9781424439102 http://scholarbank.nus.edu.sg/handle/10635/70557 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	10.1109/IPFA.2009.5232561
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Chin, A. Lin, S.H. Yang, H.J. Tsai, C.Y. Yeh, F.S. Liao, C.C. Li, M.-F.
format	Conference or Workshop Item
author	Chin, A. Lin, S.H. Yang, H.J. Tsai, C.Y. Yeh, F.S. Liao, C.C. Li, M.-F.
spellingShingle	Chin, A. Lin, S.H. Yang, H.J. Tsai, C.Y. Yeh, F.S. Liao, C.C. Li, M.-F. Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering
author_sort	Chin, A.
title	Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering
title_short	Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering
title_full	Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering
title_fullStr	Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering
title_full_unstemmed	Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering
title_sort	improved retention and cycling characteristics of monos memory using charge-trapping engineering
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/70557
_version_	1681087221680046080

Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering

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