Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

IEEE International Reliability Physics Symposium Proceedings

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Main Authors:	Hendarto, E., Altes, A., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/70694
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-706942015-01-23T19:30:01Z Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy Hendarto, E. Altes, A. Heiderhoff, R. Phang, J.C.H. Balk, L.J. ELECTRICAL & COMPUTER ENGINEERING IEEE International Reliability Physics Symposium Proceedings 294-299 2014-06-19T03:15:08Z 2014-06-19T03:15:08Z 2005 Conference Paper Hendarto, E.,Altes, A.,Heiderhoff, R.,Phang, J.C.H.,Balk, L.J. (2005). Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy. IEEE International Reliability Physics Symposium Proceedings : 294-299. ScholarBank@NUS Repository. 0780388038 15417026 http://scholarbank.nus.edu.sg/handle/10635/70694 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	IEEE International Reliability Physics Symposium Proceedings
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Hendarto, E. Altes, A. Heiderhoff, R. Phang, J.C.H. Balk, L.J.
format	Conference or Workshop Item
author	Hendarto, E. Altes, A. Heiderhoff, R. Phang, J.C.H. Balk, L.J.
spellingShingle	Hendarto, E. Altes, A. Heiderhoff, R. Phang, J.C.H. Balk, L.J. Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
author_sort	Hendarto, E.
title	Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
title_short	Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
title_full	Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
title_fullStr	Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
title_full_unstemmed	Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
title_sort	investigation on the thermal distribution of nmosfets under different operation modes by scanning thermal microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/70694
_version_	1681087247082848256

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

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