Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

IEEE International Reliability Physics Symposium Proceedings

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Bibliographic Details
Main Authors: Hendarto, E., Altes, A., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70694
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/70694

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