SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

10.1109/IRPS.2010.5488781

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Bibliographic Details
Main Authors:	Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	EBIC Electrical defects Electron Beam Induced Current Morphological defects Scanning Electron Acoustic Microscopy SEAM Solar cell
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71719
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-71719
record_format	dspace
spelling	sg-nus-scholar.10635-717192024-11-13T12:53:51Z SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING EBIC Electrical defects Electron Beam Induced Current Morphological defects Scanning Electron Acoustic Microscopy SEAM Solar cell 10.1109/IRPS.2010.5488781 IEEE International Reliability Physics Symposium Proceedings 503-507 2014-06-19T03:27:01Z 2014-06-19T03:27:01Z 2010 Conference Paper Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H. (2010). SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells. IEEE International Reliability Physics Symposium Proceedings : 503-507. ScholarBank@NUS Repository. https://doi.org/10.1109/IRPS.2010.5488781 9781424454310 15417026 http://scholarbank.nus.edu.sg/handle/10635/71719 000287515600081 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	EBIC Electrical defects Electron Beam Induced Current Morphological defects Scanning Electron Acoustic Microscopy SEAM Solar cell
spellingShingle	EBIC Electrical defects Electron Beam Induced Current Morphological defects Scanning Electron Acoustic Microscopy SEAM Solar cell Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H. SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
description	10.1109/IRPS.2010.5488781
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H.
format	Conference or Workshop Item
author	Meng, L. Nagalingam, D. Bhatia, C.S. Street, A.G. Phang, J.C.H.
author_sort	Meng, L.
title	SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
title_short	SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
title_full	SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
title_fullStr	SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
title_full_unstemmed	SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
title_sort	seam and ebic studies of morphological and electrical defects in polycrystalline silicon solar cells
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/71719
_version_	1821189513607643136

SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

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