SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

• Main Authors: Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: EBIC; Electrical defects; Electron Beam Induced Current; Morphological defects; Scanning Electron Acoustic Microscopy; SEAM; Solar cell
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/71719
• Institution: National University of Singapore

10.1109/IRPS.2010.5488781