Simulation of trapping properties of high κ material as the charge storage layer for flash memory application

Thin Solid Films

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Bibliographic Details
Main Authors: Yeo, Y.N., Wang, Y.Q., Samanta, S.K., Yoo, W.J., Samudra, G., Gao, D., Chong, C.C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/71784
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-717842023-08-14T22:01:55Z Simulation of trapping properties of high κ material as the charge storage layer for flash memory application Yeo, Y.N. Wang, Y.Q. Samanta, S.K. Yoo, W.J. Samudra, G. Gao, D. Chong, C.C. ELECTRICAL & COMPUTER ENGINEERING High κ Non-volatile memory SOHOS Traps Thin Solid Films 504 1-2 209-212 THSFA 2014-06-19T03:27:44Z 2014-06-19T03:27:44Z 2006-05-10 Conference Paper Yeo, Y.N., Wang, Y.Q., Samanta, S.K., Yoo, W.J., Samudra, G., Gao, D., Chong, C.C. (2006-05-10). Simulation of trapping properties of high κ material as the charge storage layer for flash memory application. Thin Solid Films 504 (1-2) : 209-212. ScholarBank@NUS Repository. 00406090 http://scholarbank.nus.edu.sg/handle/10635/71784 000236486200050 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic High κ
Non-volatile memory
SOHOS
Traps
spellingShingle High κ
Non-volatile memory
SOHOS
Traps
Yeo, Y.N.
Wang, Y.Q.
Samanta, S.K.
Yoo, W.J.
Samudra, G.
Gao, D.
Chong, C.C.
Simulation of trapping properties of high κ material as the charge storage layer for flash memory application
description Thin Solid Films
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Yeo, Y.N.
Wang, Y.Q.
Samanta, S.K.
Yoo, W.J.
Samudra, G.
Gao, D.
Chong, C.C.
format Conference or Workshop Item
author Yeo, Y.N.
Wang, Y.Q.
Samanta, S.K.
Yoo, W.J.
Samudra, G.
Gao, D.
Chong, C.C.
author_sort Yeo, Y.N.
title Simulation of trapping properties of high κ material as the charge storage layer for flash memory application
title_short Simulation of trapping properties of high κ material as the charge storage layer for flash memory application
title_full Simulation of trapping properties of high κ material as the charge storage layer for flash memory application
title_fullStr Simulation of trapping properties of high κ material as the charge storage layer for flash memory application
title_full_unstemmed Simulation of trapping properties of high κ material as the charge storage layer for flash memory application
title_sort simulation of trapping properties of high κ material as the charge storage layer for flash memory application
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/71784
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