Statistical noise margin estimation for sub-threshold combinational circuits

10.1109/ASPDAC.2008.4483935

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Bibliographic Details
Main Authors: Pu, Y., De Gyvez, J.P., Corporaal, H., Ha, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71864
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Institution: National University of Singapore