Statistical noise margin estimation for sub-threshold combinational circuits
10.1109/ASPDAC.2008.4483935
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Main Authors: | Pu, Y., De Gyvez, J.P., Corporaal, H., Ha, Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/71864 |
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Institution: | National University of Singapore |
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