Using probing techniques to identify and study high leakage issues in the development of 90nm process and below

Using probing techniques to identify and study high leakage issues in the development of 90nm process and below

10.1109/IPFA.2006.250997

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Bibliographic Details
Main Authors: Hendarto, E., Mai, Z., Tan, P.K., Lek, A., Lau, B., Lam, J., Chim, W.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72139
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/72139

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