Using probing techniques to identify and study high leakage issues in the development of 90nm process and below
10.1109/IPFA.2006.250997
Saved in:
| Main Authors: | , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72139 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-72139 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-721392024-11-14T10:20:46Z Using probing techniques to identify and study high leakage issues in the development of 90nm process and below Hendarto, E. Mai, Z. Tan, P.K. Lek, A. Lau, B. Lam, J. Chim, W.K. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IPFA.2006.250997 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 58-62 2014-06-19T03:31:51Z 2014-06-19T03:31:51Z 2006 Conference Paper Hendarto, E.,Mai, Z.,Tan, P.K.,Lek, A.,Lau, B.,Lam, J.,Chim, W.K. (2006). Using probing techniques to identify and study high leakage issues in the development of 90nm process and below. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 58-62. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2006.250997" target="_blank">https://doi.org/10.1109/IPFA.2006.250997</a> 1424402069 http://scholarbank.nus.edu.sg/handle/10635/72139 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1109/IPFA.2006.250997 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Hendarto, E. Mai, Z. Tan, P.K. Lek, A. Lau, B. Lam, J. Chim, W.K. |
| format |
Conference or Workshop Item |
| author |
Hendarto, E. Mai, Z. Tan, P.K. Lek, A. Lau, B. Lam, J. Chim, W.K. |
| spellingShingle |
Hendarto, E. Mai, Z. Tan, P.K. Lek, A. Lau, B. Lam, J. Chim, W.K. Using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| author_sort |
Hendarto, E. |
| title |
Using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| title_short |
Using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| title_full |
Using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| title_fullStr |
Using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| title_full_unstemmed |
Using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| title_sort |
using probing techniques to identify and study high leakage issues in the development of 90nm process and below |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72139 |
| _version_ |
1821225155684204544 |