Using probing techniques to identify and study high leakage issues in the development of 90nm process and below
10.1109/IPFA.2006.250997
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Main Authors: | Hendarto, E., Mai, Z., Tan, P.K., Lek, A., Lau, B., Lam, J., Chim, W.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72139 |
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Institution: | National University of Singapore |
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