Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
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sg-nus-scholar.10635-726762015-02-23T13:39:34Z Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements Goh, Y.H. Ling, C.H. ELECTRICAL ENGINEERING IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 23-27 00267 2014-06-19T05:10:45Z 2014-06-19T05:10:45Z 1997 Conference Paper Goh, Y.H.,Ling, C.H. (1997). Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE : 23-27. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72676 NOT_IN_WOS Scopus |
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IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Goh, Y.H. Ling, C.H. |
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Conference or Workshop Item |
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Goh, Y.H. Ling, C.H. |
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Goh, Y.H. Ling, C.H. Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
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Goh, Y.H. |
title |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
title_short |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
title_full |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
title_fullStr |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
title_full_unstemmed |
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements |
title_sort |
hot carrier degradation study in pmosfet using gated-diode drain current and charge pumping measurements |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/72676 |
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