Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements

IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

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Main Authors: Goh, Y.H., Ling, C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72676
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-726762015-02-23T13:39:34Z Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements Goh, Y.H. Ling, C.H. ELECTRICAL ENGINEERING IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 23-27 00267 2014-06-19T05:10:45Z 2014-06-19T05:10:45Z 1997 Conference Paper Goh, Y.H.,Ling, C.H. (1997). Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE : 23-27. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72676 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Goh, Y.H.
Ling, C.H.
format Conference or Workshop Item
author Goh, Y.H.
Ling, C.H.
spellingShingle Goh, Y.H.
Ling, C.H.
Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
author_sort Goh, Y.H.
title Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
title_short Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
title_full Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
title_fullStr Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
title_full_unstemmed Hot carrier degradation study in PMOSFET using gated-diode drain current and charge pumping measurements
title_sort hot carrier degradation study in pmosfet using gated-diode drain current and charge pumping measurements
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/72676
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