Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Main Authors: Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72705
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-727052015-02-03T11:30:51Z Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis Ng, T.H. Chim, W.K. Chan, D.S.H. Phang, J.C.H. Liu, Y.Y. Lou, C.L. Leang, S.E. Tao, J.M. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 113-118 00234 2014-06-19T05:11:04Z 2014-06-19T05:11:04Z 1999 Conference Paper Ng, T.H.,Chim, W.K.,Chan, D.S.H.,Phang, J.C.H.,Liu, Y.Y.,Lou, C.L.,Leang, S.E.,Tao, J.M. (1999). Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 113-118. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72705 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Ng, T.H.
Chim, W.K.
Chan, D.S.H.
Phang, J.C.H.
Liu, Y.Y.
Lou, C.L.
Leang, S.E.
Tao, J.M.
format Conference or Workshop Item
author Ng, T.H.
Chim, W.K.
Chan, D.S.H.
Phang, J.C.H.
Liu, Y.Y.
Lou, C.L.
Leang, S.E.
Tao, J.M.
spellingShingle Ng, T.H.
Chim, W.K.
Chan, D.S.H.
Phang, J.C.H.
Liu, Y.Y.
Lou, C.L.
Leang, S.E.
Tao, J.M.
Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
author_sort Ng, T.H.
title Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_short Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_full Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_fullStr Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_full_unstemmed Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
title_sort integrated (automated) photon emission microscope and mosfet characterization system for combined microscopic and macroscopic device analysis
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/72705
_version_ 1681087614311989248

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