Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-728672015-01-31T08:50:25Z Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides Teh, G.L. Chim, W.K. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 156-161 00234 2014-06-19T05:12:53Z 2014-06-19T05:12:53Z 1997 Conference Paper Teh, G.L.,Chim, W.K. (1997). Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 156-161. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72867 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Teh, G.L. Chim, W.K. |
| format |
Conference or Workshop Item |
| author |
Teh, G.L. Chim, W.K. |
| spellingShingle |
Teh, G.L. Chim, W.K. Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides |
| author_sort |
Teh, G.L. |
| title |
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides |
| title_short |
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides |
| title_full |
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides |
| title_fullStr |
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides |
| title_full_unstemmed |
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides |
| title_sort |
pre-breakdown charge trapping in esd stressed thin mos gate oxides |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72867 |
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1681087643741323264 |