Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films

10.1109/20.908917

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Bibliographic Details
Main Authors:	Leong, S.H., Wang, J.P., Low, T.S.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	In-depth defects Magnetic hardness coefficient Magneto-optical Kerr effect Saturation magnetization curve
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72946
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-729462024-11-14T00:40:45Z Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films Leong, S.H. Wang, J.P. Low, T.S. ELECTRICAL ENGINEERING In-depth defects Magnetic hardness coefficient Magneto-optical Kerr effect Saturation magnetization curve 10.1109/20.908917 IEEE Transactions on Magnetics 36 5 I 3611-3613 IEMGA 2014-06-19T05:13:47Z 2014-06-19T05:13:47Z 2000-09 Conference Paper Leong, S.H.,Wang, J.P.,Low, T.S. (2000-09). Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films. IEEE Transactions on Magnetics 36 (5 I) : 3611-3613. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/20.908917" target="_blank">https://doi.org/10.1109/20.908917</a> 00189464 http://scholarbank.nus.edu.sg/handle/10635/72946 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	In-depth defects Magnetic hardness coefficient Magneto-optical Kerr effect Saturation magnetization curve
spellingShingle	In-depth defects Magnetic hardness coefficient Magneto-optical Kerr effect Saturation magnetization curve Leong, S.H. Wang, J.P. Low, T.S. Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
description	10.1109/20.908917
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Leong, S.H. Wang, J.P. Low, T.S.
format	Conference or Workshop Item
author	Leong, S.H. Wang, J.P. Low, T.S.
author_sort	Leong, S.H.
title	Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
title_short	Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
title_full	Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
title_fullStr	Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
title_full_unstemmed	Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
title_sort	study of in-depth defects using magneto-optical kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72946
_version_	1821182715743961088

Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films

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