Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
10.1109/20.908917
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Main Authors: | Leong, S.H., Wang, J.P., Low, T.S. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72946 |
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Institution: | National University of Singapore |
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