Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films

10.1109/20.908917

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Bibliographic Details
Main Authors: Leong, S.H., Wang, J.P., Low, T.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72946
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Institution: National University of Singapore

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