A numerical study of fatigue life of copper column interconnections in wafer level packages

Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004

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Bibliographic Details
Main Authors: Sun, W., Tay, A.A.O., Vedantam, S.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73080
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-730802015-01-13T10:43:02Z A numerical study of fatigue life of copper column interconnections in wafer level packages Sun, W. Tay, A.A.O. Vedantam, S. MECHANICAL ENGINEERING Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004 318-323 2014-06-19T05:30:56Z 2014-06-19T05:30:56Z 2004 Conference Paper Sun, W.,Tay, A.A.O.,Vedantam, S. (2004). A numerical study of fatigue life of copper column interconnections in wafer level packages. Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004 : 318-323. ScholarBank@NUS Repository. 0780388216 http://scholarbank.nus.edu.sg/handle/10635/73080 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
Sun, W.
Tay, A.A.O.
Vedantam, S.
format Conference or Workshop Item
author Sun, W.
Tay, A.A.O.
Vedantam, S.
spellingShingle Sun, W.
Tay, A.A.O.
Vedantam, S.
A numerical study of fatigue life of copper column interconnections in wafer level packages
author_sort Sun, W.
title A numerical study of fatigue life of copper column interconnections in wafer level packages
title_short A numerical study of fatigue life of copper column interconnections in wafer level packages
title_full A numerical study of fatigue life of copper column interconnections in wafer level packages
title_fullStr A numerical study of fatigue life of copper column interconnections in wafer level packages
title_full_unstemmed A numerical study of fatigue life of copper column interconnections in wafer level packages
title_sort numerical study of fatigue life of copper column interconnections in wafer level packages
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/73080
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