Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects

Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005

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Bibliographic Details
Main Authors: Wei, S., Tay, A.A.O., Vedantam, S.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73859
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-738592015-01-09T07:08:50Z Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects Wei, S. Tay, A.A.O. Vedantam, S. MECHANICAL ENGINEERING Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005 2 444-450 2014-06-19T05:40:13Z 2014-06-19T05:40:13Z 2005 Conference Paper Wei, S.,Tay, A.A.O.,Vedantam, S. (2005). Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects. Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005 2 : 444-450. ScholarBank@NUS Repository. 0780395786 http://scholarbank.nus.edu.sg/handle/10635/73859 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
Wei, S.
Tay, A.A.O.
Vedantam, S.
format Conference or Workshop Item
author Wei, S.
Tay, A.A.O.
Vedantam, S.
spellingShingle Wei, S.
Tay, A.A.O.
Vedantam, S.
Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
author_sort Wei, S.
title Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
title_short Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
title_full Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
title_fullStr Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
title_full_unstemmed Simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
title_sort simulation-based design optimization of solder joint reliability of wafer level copper column interconnects
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/73859
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