Test structures for new MEMS sensors and devices
Proceedings of SPIE - The International Society for Optical Engineering
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sg-nus-scholar.10635-739232015-02-05T14:32:09Z Test structures for new MEMS sensors and devices Tay Eng Hock, F. Koon Hwee, T. MECHANICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering 4746 I 504-513 PSISD 2014-06-19T05:41:00Z 2014-06-19T05:41:00Z 2002 Conference Paper Tay Eng Hock, F.,Koon Hwee, T. (2002). Test structures for new MEMS sensors and devices. Proceedings of SPIE - The International Society for Optical Engineering 4746 I : 504-513. ScholarBank@NUS Repository. 0277786X http://scholarbank.nus.edu.sg/handle/10635/73923 NOT_IN_WOS Scopus |
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Proceedings of SPIE - The International Society for Optical Engineering |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Tay Eng Hock, F. Koon Hwee, T. |
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Conference or Workshop Item |
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Tay Eng Hock, F. Koon Hwee, T. |
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Tay Eng Hock, F. Koon Hwee, T. Test structures for new MEMS sensors and devices |
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Tay Eng Hock, F. |
title |
Test structures for new MEMS sensors and devices |
title_short |
Test structures for new MEMS sensors and devices |
title_full |
Test structures for new MEMS sensors and devices |
title_fullStr |
Test structures for new MEMS sensors and devices |
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Test structures for new MEMS sensors and devices |
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test structures for new mems sensors and devices |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/73923 |
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