High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices
Proceedings - Electrochemical Society
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2014
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sg-nus-scholar.10635-774492015-01-23T19:10:33Z High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices Toh, S.L. Loh, K.P. See, K.S. Boothroyd, C.B. Li, K. Lau, W.S. Ang, C.H. Chan, L. CHEMISTRY Proceedings - Electrochemical Society PV 2005-05 561-568 2014-06-23T05:55:10Z 2014-06-23T05:55:10Z 2005 Conference Paper Toh, S.L.,Loh, K.P.,See, K.S.,Boothroyd, C.B.,Li, K.,Lau, W.S.,Ang, C.H.,Chan, L. (2005). High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices. Proceedings - Electrochemical Society PV 2005-05 : 561-568. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/77449 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Proceedings - Electrochemical Society |
| author2 |
CHEMISTRY |
| author_facet |
CHEMISTRY Toh, S.L. Loh, K.P. See, K.S. Boothroyd, C.B. Li, K. Lau, W.S. Ang, C.H. Chan, L. |
| format |
Conference or Workshop Item |
| author |
Toh, S.L. Loh, K.P. See, K.S. Boothroyd, C.B. Li, K. Lau, W.S. Ang, C.H. Chan, L. |
| spellingShingle |
Toh, S.L. Loh, K.P. See, K.S. Boothroyd, C.B. Li, K. Lau, W.S. Ang, C.H. Chan, L. High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| author_sort |
Toh, S.L. |
| title |
High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| title_short |
High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| title_full |
High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| title_fullStr |
High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| title_full_unstemmed |
High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| title_sort |
high spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/77449 |
| _version_ |
1681088465931862016 |