A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's
10.1109/55.748912
Saved in:
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Subjects: | |
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80278 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-80278 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-802782023-10-27T07:14:54Z A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME Electron traps Hot-carrier degradation MOSFET's Post-stress interface trap generation 10.1109/55.748912 IEEE Electron Device Letters 20 3 135-137 EDLED 2014-10-07T02:55:45Z 2014-10-07T02:55:45Z 1999-03 Article Ang, D.S., Ling, C.H. (1999-03). A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's. IEEE Electron Device Letters 20 (3) : 135-137. ScholarBank@NUS Repository. https://doi.org/10.1109/55.748912 07413106 http://scholarbank.nus.edu.sg/handle/10635/80278 000078910800010 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
Electron traps Hot-carrier degradation MOSFET's Post-stress interface trap generation |
| spellingShingle |
Electron traps Hot-carrier degradation MOSFET's Post-stress interface trap generation Ang, D.S. Ling, C.H. A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's |
| description |
10.1109/55.748912 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. |
| format |
Article |
| author |
Ang, D.S. Ling, C.H. |
| author_sort |
Ang, D.S. |
| title |
A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's |
| title_short |
A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's |
| title_full |
A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's |
| title_fullStr |
A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's |
| title_full_unstemmed |
A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's |
| title_sort |
new model for the post-stress interface trap generation in hot-carrier stressed p-mosfet's |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80278 |
| _version_ |
1781783895429087232 |