A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's
10.1109/16.658824
Saved in:
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80284 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-80284 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-802842023-10-26T07:58:46Z A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME 10.1109/16.658824 IEEE Transactions on Electron Devices 45 1 149-159 IETDA 2014-10-07T02:55:50Z 2014-10-07T02:55:50Z 1998 Article Ang, D.S., Ling, C.H. (1998). A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's. IEEE Transactions on Electron Devices 45 (1) : 149-159. ScholarBank@NUS Repository. https://doi.org/10.1109/16.658824 00189383 http://scholarbank.nus.edu.sg/handle/10635/80284 000071225200020 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1109/16.658824 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. |
| format |
Article |
| author |
Ang, D.S. Ling, C.H. |
| spellingShingle |
Ang, D.S. Ling, C.H. A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's |
| author_sort |
Ang, D.S. |
| title |
A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's |
| title_short |
A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's |
| title_full |
A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's |
| title_fullStr |
A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's |
| title_full_unstemmed |
A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's |
| title_sort |
unified model for the self-limiting hot-carrier degradation in ldd n-mosfet's |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80284 |
| _version_ |
1781783896402165760 |