Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's

10.1109/16.644662

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Main Author:	Ling, C.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80326
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-80326
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spelling	sg-nus-scholar.10635-803262023-08-31T21:42:12Z Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's Ling, C.H. ELECTRICAL ENGINEERING 10.1109/16.644662 IEEE Transactions on Electron Devices 44 12 2309-2311 IETDA 2014-10-07T02:56:18Z 2014-10-07T02:56:18Z 1997 Article Ling, C.H. (1997). Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's. IEEE Transactions on Electron Devices 44 (12) : 2309-2311. ScholarBank@NUS Repository. https://doi.org/10.1109/16.644662 00189383 http://scholarbank.nus.edu.sg/handle/10635/80326 A1997YH43200031 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1109/16.644662
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ling, C.H.
format	Article
author	Ling, C.H.
spellingShingle	Ling, C.H. Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's
author_sort	Ling, C.H.
title	Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's
title_short	Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's
title_full	Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's
title_fullStr	Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's
title_full_unstemmed	Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's
title_sort	close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed pmosfet's
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80326
_version_	1776257895254458368

Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's

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