Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements
10.1088/0268-1242/11/5/005
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2014
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sg-nus-scholar.10635-803582024-11-14T10:20:44Z Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements Chen, T.P. Chan, D.S.H. Chim, W.K. ELECTRICAL ENGINEERING 10.1088/0268-1242/11/5/005 Semiconductor Science and Technology 11 5 672-678 SSTEE 2014-10-07T02:56:39Z 2014-10-07T02:56:39Z 1996-05 Article Chen, T.P., Chan, D.S.H., Chim, W.K. (1996-05). Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements. Semiconductor Science and Technology 11 (5) : 672-678. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/11/5/005 02681242 http://scholarbank.nus.edu.sg/handle/10635/80358 A1996UJ83800003 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| description |
10.1088/0268-1242/11/5/005 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Chen, T.P. Chan, D.S.H. Chim, W.K. |
| format |
Article |
| author |
Chen, T.P. Chan, D.S.H. Chim, W.K. |
| spellingShingle |
Chen, T.P. Chan, D.S.H. Chim, W.K. Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements |
| author_sort |
Chen, T.P. |
| title |
Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements |
| title_short |
Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements |
| title_full |
Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements |
| title_fullStr |
Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements |
| title_full_unstemmed |
Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements |
| title_sort |
determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of mosfets by gate-controlled-diode measurements |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80358 |
| _version_ |
1821202152264040448 |