Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses
10.1088/0268-1242/11/10/005
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sg-nus-scholar.10635-805452024-11-14T10:20:21Z Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. ELECTRICAL ENGINEERING 10.1088/0268-1242/11/10/005 Semiconductor Science and Technology 11 10 1381-1387 SSTEE 2014-10-07T02:58:42Z 2014-10-07T02:58:42Z 1996-10 Article Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y. (1996-10). Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses. Semiconductor Science and Technology 11 (10) : 1381-1387. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/11/10/005 02681242 http://scholarbank.nus.edu.sg/handle/10635/80545 A1996VU74700002 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1088/0268-1242/11/10/005 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. |
| format |
Article |
| author |
Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. |
| spellingShingle |
Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses |
| author_sort |
Lou, C.L. |
| title |
Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses |
| title_short |
Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses |
| title_full |
Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses |
| title_fullStr |
Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses |
| title_full_unstemmed |
Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stresses |
| title_sort |
hot-carrier induced degradation of polysilicon and tungsten polycide gate mosfets under maximum substrate and gate current stresses |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80545 |
| _version_ |
1821182689691041792 |