Interface roughness effects on the currents of resonant tunnelling hot electron transistor

Interface roughness effects on the currents of resonant tunnelling hot electron transistor

10.1088/0022-3727/27/8/018

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Bibliographic Details
Main Authors: Sheng, Hanyu, Chua, Soo-Jin
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80620
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Institution: National University of Singapore
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Summary:10.1088/0022-3727/27/8/018

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