Interface roughness effects on the currents of resonant tunnelling hot electron transistor

10.1088/0022-3727/27/8/018

Saved in:

Bibliographic Details
Main Authors:	Sheng, Hanyu, Chua, Soo-Jin
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80620
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-80620
record_format	dspace
spelling	sg-nus-scholar.10635-806202023-10-29T20:23:49Z Interface roughness effects on the currents of resonant tunnelling hot electron transistor Sheng, Hanyu Chua, Soo-Jin ELECTRICAL ENGINEERING 10.1088/0022-3727/27/8/018 Journal of Physics D: Applied Physics 27 8 1703-1706 JPAPB 2014-10-07T02:59:30Z 2014-10-07T02:59:30Z 1994 Article Sheng, Hanyu, Chua, Soo-Jin (1994). Interface roughness effects on the currents of resonant tunnelling hot electron transistor. Journal of Physics D: Applied Physics 27 (8) : 1703-1706. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/27/8/018 00223727 http://scholarbank.nus.edu.sg/handle/10635/80620 A1994PD63200018 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1088/0022-3727/27/8/018
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Sheng, Hanyu Chua, Soo-Jin
format	Article
author	Sheng, Hanyu Chua, Soo-Jin
spellingShingle	Sheng, Hanyu Chua, Soo-Jin Interface roughness effects on the currents of resonant tunnelling hot electron transistor
author_sort	Sheng, Hanyu
title	Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_short	Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_full	Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_fullStr	Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_full_unstemmed	Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_sort	interface roughness effects on the currents of resonant tunnelling hot electron transistor
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80620
_version_	1781783928027217920

Interface roughness effects on the currents of resonant tunnelling hot electron transistor

Similar Items