Interface roughness effects on the currents of resonant tunnelling hot electron transistor
10.1088/0022-3727/27/8/018
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Main Authors: | Sheng, Hanyu, Chua, Soo-Jin |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80620 |
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Institution: | National University of Singapore |
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