Interface roughness effects on the currents of resonant tunnelling hot electron transistor

10.1088/0022-3727/27/8/018

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Sheng, Hanyu, Chua, Soo-Jin
مؤلفون آخرون: ELECTRICAL ENGINEERING
التنسيق: مقال
منشور في: 2014
الوصول للمادة أونلاين:http://scholarbank.nus.edu.sg/handle/10635/80620
الوسوم: إضافة وسم
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المؤسسة: National University of Singapore
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spelling sg-nus-scholar.10635-806202024-11-14T02:29:07Z Interface roughness effects on the currents of resonant tunnelling hot electron transistor Sheng, Hanyu Chua, Soo-Jin ELECTRICAL ENGINEERING 10.1088/0022-3727/27/8/018 Journal of Physics D: Applied Physics 27 8 1703-1706 JPAPB 2014-10-07T02:59:30Z 2014-10-07T02:59:30Z 1994 Article Sheng, Hanyu, Chua, Soo-Jin (1994). Interface roughness effects on the currents of resonant tunnelling hot electron transistor. Journal of Physics D: Applied Physics 27 (8) : 1703-1706. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/27/8/018 00223727 http://scholarbank.nus.edu.sg/handle/10635/80620 A1994PD63200018 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1088/0022-3727/27/8/018
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Sheng, Hanyu
Chua, Soo-Jin
format Article
author Sheng, Hanyu
Chua, Soo-Jin
spellingShingle Sheng, Hanyu
Chua, Soo-Jin
Interface roughness effects on the currents of resonant tunnelling hot electron transistor
author_sort Sheng, Hanyu
title Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_short Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_full Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_fullStr Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_full_unstemmed Interface roughness effects on the currents of resonant tunnelling hot electron transistor
title_sort interface roughness effects on the currents of resonant tunnelling hot electron transistor
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80620
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