Investigation of interface traps in LDD pMOST's by the DCIV method
10.1109/55.644078
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sg-nus-scholar.10635-806342023-10-30T07:11:27Z Investigation of interface traps in LDD pMOST's by the DCIV method Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. ELECTRICAL ENGINEERING 10.1109/55.644078 IEEE Electron Device Letters 18 12 583-585 EDLED 2014-10-07T02:59:39Z 2014-10-07T02:59:39Z 1997-12 Article Jie, B.B., Li, M.F., Lou, C.L., Chim, W.K., Chan, D.S.H., Lo, K.F. (1997-12). Investigation of interface traps in LDD pMOST's by the DCIV method. IEEE Electron Device Letters 18 (12) : 583-585. ScholarBank@NUS Repository. https://doi.org/10.1109/55.644078 07413106 http://scholarbank.nus.edu.sg/handle/10635/80634 A1997YH55200003 Scopus |
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National University of Singapore |
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NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
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ScholarBank@NUS |
| description |
10.1109/55.644078 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. |
| format |
Article |
| author |
Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. |
| spellingShingle |
Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. Investigation of interface traps in LDD pMOST's by the DCIV method |
| author_sort |
Jie, B.B. |
| title |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_short |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_full |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_fullStr |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_full_unstemmed |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_sort |
investigation of interface traps in ldd pmost's by the dciv method |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80634 |
| _version_ |
1781783929811894272 |