Investigation of interface traps in LDD pMOST's by the DCIV method

10.1109/55.644078

Saved in:
Bibliographic Details
Main Authors: Jie, B.B., Li, M.F., Lou, C.L., Chim, W.K., Chan, D.S.H., Lo, K.F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80634
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items