Correlation between gate induced drain leakage and plasma induced interface traps

Correlation between gate induced drain leakage and plasma induced interface traps

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Siguang, M., Yaohui, Z., Li, M.F., Li, W., Wang, J.L.F., Yen, A.C., Sheng, G.T.T.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81393
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/81393

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