Correlation between gate induced drain leakage and plasma induced interface traps
Materials Research Society Symposium - Proceedings
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2014
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sg-nus-scholar.10635-813932015-01-08T19:16:36Z Correlation between gate induced drain leakage and plasma induced interface traps Siguang, M. Yaohui, Z. Li, M.F. Li, W. Wang, J.L.F. Yen, A.C. Sheng, G.T.T. ELECTRICAL ENGINEERING Materials Research Society Symposium - Proceedings 592 117-122 MRSPD 2014-10-07T03:07:50Z 2014-10-07T03:07:50Z 2000 Conference Paper Siguang, M.,Yaohui, Z.,Li, M.F.,Li, W.,Wang, J.L.F.,Yen, A.C.,Sheng, G.T.T. (2000). Correlation between gate induced drain leakage and plasma induced interface traps. Materials Research Society Symposium - Proceedings 592 : 117-122. ScholarBank@NUS Repository. 02729172 http://scholarbank.nus.edu.sg/handle/10635/81393 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Materials Research Society Symposium - Proceedings |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Siguang, M. Yaohui, Z. Li, M.F. Li, W. Wang, J.L.F. Yen, A.C. Sheng, G.T.T. |
| format |
Conference or Workshop Item |
| author |
Siguang, M. Yaohui, Z. Li, M.F. Li, W. Wang, J.L.F. Yen, A.C. Sheng, G.T.T. |
| spellingShingle |
Siguang, M. Yaohui, Z. Li, M.F. Li, W. Wang, J.L.F. Yen, A.C. Sheng, G.T.T. Correlation between gate induced drain leakage and plasma induced interface traps |
| author_sort |
Siguang, M. |
| title |
Correlation between gate induced drain leakage and plasma induced interface traps |
| title_short |
Correlation between gate induced drain leakage and plasma induced interface traps |
| title_full |
Correlation between gate induced drain leakage and plasma induced interface traps |
| title_fullStr |
Correlation between gate induced drain leakage and plasma induced interface traps |
| title_full_unstemmed |
Correlation between gate induced drain leakage and plasma induced interface traps |
| title_sort |
correlation between gate induced drain leakage and plasma induced interface traps |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81393 |
| _version_ |
1681089063064436736 |