Correlation between gate induced drain leakage and plasma induced interface traps
Materials Research Society Symposium - Proceedings
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Main Authors: | Siguang, M., Yaohui, Z., Li, M.F., Li, W., Wang, J.L.F., Yen, A.C., Sheng, G.T.T. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81393 |
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Institution: | National University of Singapore |
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