Correlation between gate induced drain leakage and plasma induced interface traps

• Main Authors: Siguang, M., Yaohui, Z., Li, M.F., Li, W., Wang, J.L.F., Yen, A.C., Sheng, G.T.T.
• 其他作者: ELECTRICAL ENGINEERING
• 格式: Conference or Workshop Item
• 出版: 2014
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/81393
• 機構: National University of Singapore

Materials Research Society Symposium - Proceedings