Correlation between gate induced drain leakage and plasma induced interface traps

• Main Authors: Siguang, M., Yaohui, Z., Li, M.F., Li, W., Wang, J.L.F., Yen, A.C., Sheng, G.T.T.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/81393
• Institution: National University of Singapore

Materials Research Society Symposium - Proceedings