Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing
10.1109/55.720187
Saved in:
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80690 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-80690 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-806902023-10-30T20:09:09Z Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing Chim, W.K. Yeo, B.P. Lim, P.S. Chan, D.S.H. ELECTRICAL ENGINEERING 10.1109/55.720187 IEEE Electron Device Letters 19 10 363-366 EDLED 2014-10-07T03:00:15Z 2014-10-07T03:00:15Z 1998-10 Article Chim, W.K., Yeo, B.P., Lim, P.S., Chan, D.S.H. (1998-10). Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing. IEEE Electron Device Letters 19 (10) : 363-366. ScholarBank@NUS Repository. https://doi.org/10.1109/55.720187 07413106 http://scholarbank.nus.edu.sg/handle/10635/80690 000076221200001 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1109/55.720187 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Chim, W.K. Yeo, B.P. Lim, P.S. Chan, D.S.H. |
| format |
Article |
| author |
Chim, W.K. Yeo, B.P. Lim, P.S. Chan, D.S.H. |
| spellingShingle |
Chim, W.K. Yeo, B.P. Lim, P.S. Chan, D.S.H. Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| author_sort |
Chim, W.K. |
| title |
Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| title_short |
Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| title_full |
Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| title_fullStr |
Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| title_full_unstemmed |
Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| title_sort |
low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80690 |
| _version_ |
1781783932982788096 |